Test
& Measurement
The testing of 21st century communications
systems, devices and functions demands a completely
new set of procedures and hardware. With speeds regularly
beyond 1 GHz, test equipment must be extremely precise
and variables that could be ignored at lower frequencies
make a significant impact at high frequencies. Additionally,
XG test equipment is largely digital and either software-configurable
or modular. These sessions will discuss the equipment,
testing methodologies and issues around testing modern
radios. The attendee will gain a fundamental understanding
of this equipment, its functionality and application
to innovative modern wireless equipment.
Next
Broadcast Date: September 14, 2005
Speaker
Michael
Keeley
CDMA
Market Segment Manager
Spirent Communications
Technology
Topic: MEID Testing for CDMA2000 Handsets
Devised in response to the rapid
depletion of Electronic Serial Numbers (ESNs), the
Mobile Equipment Identifier (MEID) initiative has
a significant impact on network operators, handset
manufacturers, and mobile subscribers alike. Spirent
Communications will present on MEID and the impact
on the CDMA2000 industry. In this presentation, Mike
Keeley, CDMA market segment manager for Spirent Communications
will address the following key questions:
• What is it MEID?
• Why do we need
it?
• When do we need it?
• How do we test it?
Next
Broadcast Date: September 14, 2005
Richard Theiss
Product
Manager/Senior Applications Engineer
Boonton Electronics (A Wireless Telecom Group Company)
Technology
Topic: Statistical Methods Simplify RF Power Measurements
Statistical power measurement
methods in RF peak power meters have been around for
over a decade but the value of using these methods
for detailed power analysis has increased recently
due to the complex modulation used in many communications
systems. This presentation will explore how statistical
methods can simplify RF power measurements in specific
applications such as Code Division Multiple Access
(CDMA), wireless networks (WLAN, 802.11), and Time
Division Synchronous Code Division Multiple Access
(TD-SCDMA). It will also include an overview of the
probability functions used to analyze these signals.
Original
broadcast: June 22, 2005
Speaker
Joseph
E. Kovacs
Product
Marketing Manager
National Instruments
Technology
Topic: A Software-Based Test Architecture for Emerging
Wireless Technologies
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On-Demand
Wireless standards are inundating
the market. The rate at which these new standards
are being developed is increasing at an extreme rate
with no letup in sight. Given this swift adoption
of new technologies, it is not uncommon to find the
same device implementing multiple wireless technologies.
This trend places tremendous demands on the device
manufacturer and the test engineer as well as the
tools necessary to meet these challenges. A modular,
software-based test architecture has the capability
to address new communications standards without necessitating
continual, large capital investments. This session
will address current and emerging wireless standards
and their requirements and how a modular test architecture
can meet these challenges.
Original
broadcast: June 22, 2005
Matthias
Weber
Senior
Product Marketing Manager
Willtek Communications
Technology
Topic: WCDMA Technology and Testing
View
On-Demand
This presentation will provide a complete overview
about the Wideband Code Division Multiple Access (WCDMA)
technology, the access technology behind the third
generation network for mobile communication. It will
discuss the technical background, including the separation
of the different subscribers via orthogonal codes.
Furthermore, it will explain the generation of an
uplink and downlink signal as a combination so different
code channels, responsible for transmitting user or
signalling data. And finally, it will explain the
measurements required by the standardization bodies
to do a final test with a 3G mobile phone.
The conference program is currently
in development. Please check back soon
for confirmed sessions. If you are interested in speaking,
please contact
Ernest Worthman, Conference Chair, eworthman@reedbusiness.com
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